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2021, vol. 62, iss. 1, pp. 41-50
Detailed characterization of the Ti-O based thin films obtained by cathodic arc evaporation
aUniversity of Belgrade, Institute of Nuclear Sciences 'Vinča', Belgrade-Vinča + ALBOS d.o.o., Belgrade
bUniversity of Belgrade, Institute of Nuclear Sciences 'Vinča', Belgrade-Vinča + Universidade Nova de Lisboa, CEFITEC, Departamento de Física, Faculdade de Ciências e Tecnologia, Lisboa, Portugal
cUniversity of Belgrade, Institute of Nuclear Sciences 'Vinča', Belgrade-Vinča
dENEA, Laboratory of Innovative Devices (DTEFSD-DIN), Portici (NA), Italy
eSGL Carbon, Weisbaden, Germany
fSt. Cyril and Methodius University, Institute of Physics, Faculty for Natural Sciences and Mathematics, Skopje, Republic of North Macedonia + Plasma Doo, Skopje, Republic of North Macedonia
Chemical and structural designing of nanomaterials for application in medicine and tissue engineering (MESTD - 172026)
Functional, Functionalized and Advanced Nanomaterials (MESTD - 45005)
Portuguese National Funding Agency for Science, Research and Technology in the framework of the project UID/FIS/00068/2019

Keywords: titanium oxide thin films; XRD; FTIR; SEM; XPS; ellipsometry
Physicochemical properties of thin films on the base of titanium oxides, obtained by a cathodic arc evaporation on the surface of glass substrate are analysed in details. The analysis of these films was made by using XRD, FTIR, SEM, XPS analysis and ellipsometry. On the basis of these analyses, particularly analysis obtained by XPS, the oxidative state Ti and corresponding phases are determined through various film layers from the surface to the substrate. The depth of the various levels and their extinction coefficients and refractory indexes are estimated by ellipsometry.
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article language: English
document type: Scientific Paper
DOI: 10.5937/zasmat2101041J
received: 22/11/2020
accepted: 10/12/2020
published in SCIndeks: 13/03/2021
Creative Commons License 4.0

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